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作者 Tan, Cher Ming, 1959-
書名 Electromigration in ULSI interconnections [electronic resource] / Cher Ming Tan
出版項 Hackensack, N.J. : World Scientific, c2010
國際標準書號 9814273325
9789814273329
9789814273336 (e-book)
說明 xix, 291 p. : ill. (some col.), col. port
系列 International series on advances in solid state electronics and technology (ASSET)
International series on advances in solid state electronics and technology
附註 Includes bibliographical references and index
Electronic reproduction. Palo Alto, Calif. : ebrary, 2013. Available via World Wide Web. Access may be limited to ebrary affiliated libraries
主題 Integrated circuits -- Ultra large scale integration
Electrodiffusion
Electronic books. local
Alt Author ebrary, Inc
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