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書名 Design and test technology for dependable systems-on-chip [electronic resource] / Raimund Ubar, Jaan Raik, and Heinrich Theodor Vierhaus, editors
出版項 Hershey, Pa. : IGI Global (701 E. Chocolate Avenue, Hershey, Pennsylvania, 17033, USA), c2011
國際標準書號 9781609602147 (ebook)
9781609602123 (hardcover)
1609602129 (hardcover)
book jacket
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