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作者 Marguí, Eva
書名 X-ray fluorescence spectrometry and related techniques [electronic resource] : an introduction / Eva Marguí, René Van Grieken
出版項 [New York, N.Y.] (222 East 46th Street, New York, NY 10017) : Momentum Press, 2013
國際標準書號 9781606503935 (electronic bk.)
1606503936 (electronic bk.)
9781606503911 (print)
160650391X (print)
國際標準號碼 10.5643/9781606503935 doi
book jacket
說明 1 electronic text (xv, 142 p.) : ill., digital file
附註 Includes bibliographical references (p. 133-138) and index
Preface -- Series preface -- Series editor -- About the authors --
1. Introduction -- 1.1 Basic principles of x-ray fluorescence -- 1.2 Interactions of x-rays with matter -- 1.3 X-ray safety and protection --
2. Basic components of x-ray fluorescence spectrometers -- 2.1 General introduction -- 2.2 Excitation sources -- 2.2.1 X-ray tubes -- 2.2.2 Radioisotopes -- 2.2.3 Other sources -- 2.3 Sample chamber -- 2.4 Detection system -- 2.4.1 Types of detectors -- 2.4.1.1 Gas-filled detectors -- 2.4.1.2 Scintillation detectors -- 2.4.1.3 Solid-state detectors -- 2.4.2 Resolution and efficiency -- 2.4.2.1 Resolution -- 2.4.2.2 Efficiency -- 2.4.3 Comparison of detection systems -- 2.4.4 Detector artifacts -- 2.4.4.1 Escape peaks -- 2.4.4.2 Sum peaks (pile-up effect) -- 2.4.5 Signal processing system -- 2.5 Source and detector modifiers -- 2.5.1 Filters -- 2.5.1.1 Primary filters -- 2.5.1.2 Detector filters -- 2.5.2 Secondary targets -- 2.5.3 Focusing optics -- 2.5.4 Dispersing systems -- 2.5.5 Collimators -- 2.5.6 Masks -- 2.6 Instrument configurations --
3. Qualitative and quantitative x-ray fluorescence analysis -- 3.1 Evaluation of x-ray fluorescence spectra -- 3.2 Qualitative XRF analysis -- 3.3 Quantitative XRF analysis -- 3.3.1 Chemical matrix effects -- 3.3.1.1 Absorption effects -- 3.3.1.2 Enhancement effects -- 3.3.2 Correction and compensation methods -- 3.3.2.1 Compensation methods -- 3.3.2.2 Matrix correction methods -- 3.3.2.3 Overview of correction and compensation methods -- 3.3.3 Quality of XRF analytical results -- 3.3.3.1 Limits of detection (LOD) and quantification (LOQ) -- 3.3.3.2 Working range and linearity -- 3.3.3.3 Precision and accuracy -- 3.3.3.4 Quality control of the results --
4. Sample preparation procedures -- 4.1 Introduction -- 4.2 General sample preparation procedures -- 4.2.1 Solid samples -- 4.2.1.1 Direct XRF analysis -- 4.2.1.2 Powdered specimen -- 4.2.1.3 Fused specimen -- 4.2.1.4 Digested specimen -- 4.2.2 Liquid samples -- 4.2.2.1 Preconcentration methods -- 4.3 Specific sample preparation procedures --
5. Wavelength/energy dispersive x-ray fluorescence spectrometry (WDXRF/EDXRF) -- 5.1 Introduction and basic principles -- 5.2 WDXRF and EDXRF layouts -- 5.2.1 WDXRF instrumentation -- 5.2.2 EDXRF instrumentation -- 5.3 Comparison of WDXRF and EDXRF systems -- 5.4 Applications of WDXRF and case studies -- 5.4.1 Determination of metal residues in active pharmaceutical ingredients -- 5.4.2 Determination of heavy metal content in automotive -- shredder residues (ASR) -- 5.4.3 Metal determination in polluted soils and waters -- 5.5 Applications of EDXRF and case studies -- 5.5.1 Determination of heavy metals at trace levels in vegetation samples -- 5.5.2 Determination of Cu, Ni, Zn, Pb, and Cd in aqueous samples -- 5.5.3 Chemical characterization of aerosol samples --
6. Total Reflection X-Ray Spectrometry (TXRF) -- 6.1 Introduction and basic principles -- 6.2 TXRF layout -- 6.3 Analytical capabilities of TXRF systems -- 6.3.1 Chemical analysis -- 6.3.1.1 Sample carriers -- 6.3.1.2 Sample treatment procedures for chemical analysis by TXRF -- 6.3.1.3 Quantification -- 6.3.2 Surface analysis -- 6.4 Other applications of TXRF and case studies -- 6.4.1 Multielement determination in waste water effluents -- 6.4.2 Determination of trace amounts of Se in soil samples -- 6.4.3 Analysis of Si wafer surfaces --
7. Special XRF configurations and related techniques -- 7.1 Introduction -- 7.2 Microbeam X-ray fluorescence spectrometry ([mu]-XRF) -- 7.3 Synchrotron radiation-induced X-ray emission (SRXRF or SRIXE) -- 7.4 Particle-induced X-ray emission (PIXE) -- 7.5 Electron-induced X-ray emission -- 7.5.1 Scanning electron microscope (SEM) -- 7.5.2 Electron microprobe analysis (EMPA) --
8. Overview of XRF and related techniques -- 8.1 Introduction -- 8.2 Comparative performance of XRF systems -- 8.3 Role of XRF spectrometry in analysis field -- 8.4 Future perspectives --
Buyer's guide to manufacturers -- Glossary of abbreviations and acronyms -- References -- Bibliography -- Books and encyclopedia chapters -- Journals -- Index
Restricted to libraries which purchase an unrestricted PDF download via an IP
X-ray fluorescence spectrometry (XRF) is a well-established analytical technique for qualitative and quantitative elemental analysis of a wide variety of routine quality control and research samples. Among its many desirable features, it delivers true multi-element character analysis, acceptable speed and economy, easy of automation, and the capacity to analyze solid samples. This remarkable contribution to this field provides a comprehensive and up-to-date account of basic principles, recent developments, instrumentation, sample preparation procedures, and applications of XRF analysis. If you are a professional in materials science, analytic chemistry, or physics, you will benefit from not only the review of basics, but also the newly developed technologies with XRF
Also available in print
Electronic reproduction. Ann Arbor, MI : ProQuest, 2015. Available via World Wide Web. Access may be limited to ProQuest affiliated libraries
Mode of access: World Wide Web
System requirements: Adobe Acrobat reader
Title from PDF t.p. (viewed on February 22, 2013)
鏈接 Print version: 160650391X 9781606503911
主題 X-ray spectroscopy
X-ray fluorescence spectrometry (XRF)
Energy dispersive X-ray fluorescence spectrometry (EDXRF)
Wavelength dispersive X-ray fluorescence spectrometry (WDXRF)
Total reflection X-ray fluorescence spectrometry (TXRF)
Micro-XRF
Synchrotron radiation-induced X-ray emission (SRXRF)
Metals
Sample preparation
XRF instrumentation
Industrial analysis
Environmental analysis
Geochemical analysis
Electronic books
Alt Author Grieken, R. van (René)
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