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書名 Industrial X-ray computed tomography / edited by Simone Carmignato, Wim Dewulf, Richard Leach
出版項 Cham : Springer International Publishing : Imprint: Springer, 2018
國際標準書號 9783319595733 (electronic bk.)
9783319595719 (paper)
國際標準號碼 10.1007/978-3-319-59573-3 doi
book jacket
說明 1 online resource (v, 369 pages) : illustrations, digital ; 24 cm
text txt rdacontent
computer c rdamedia
online resource cr rdacarrier
text file PDF rda
附註 Introduction -- Principles of X-ray computed tomography -- Technical concepts and components -- Processing and visualization of CT data -- Computer simulation -- Error sources -- Performance verification -- Traceability of CT dimensional measurements -- CT for non-destructive testing and materials characterization -- CT for dimensional metrology -- Other industrial applications
This book covers all aspects of industrial X-Ray computed tomography (XCT) including history, basics, different instrument architectures, hardware and software, error sources, traceability and calibration, and applications. The book is intended for users and developers of XCT instrumentation and software in both industry and academia, being also suitable for postgraduate students
Host Item Springer eBooks
主題 Tomography -- Industrial applications
Materials Science
Characterization and Evaluation of Materials
Manufacturing, Machines, Tools
Optical and Electronic Materials
Atomic, Molecular, Optical and Plasma Physics
Alt Author Carmignato, Simone, editor
Dewulf, Wim, editor
Leach, Richard, editor
SpringerLink (Online service)
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