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作者 Yu, Hak-Soo
書名 BIST-based performance characterization of mixed-signal circuits
國際標準書號 0496014552
book jacket
說明 212 p
附註 Source: Dissertation Abstracts International, Volume: 65-08, Section: B, page: 4210
Supervisor: Jacob A. Abraham
Thesis (Ph.D.)--The University of Texas at Austin, 2004
Mixed-signal devices have been gaining popularity with major thrusts in the development of wireless communication and multi-media markets. Consequently, testing such circuits has become a crucial issue. This dissertation focuses on the study of cost-effective test methods for mixed-signal devices. Built-In Self-Test (BIST) has been proposed and developed as one of the most promising solutions for mixed-signal testing. However, most techniques developed for mixed-signal BIST are application-specific rather than general purpose solutions. A general BIST approach would have the flexibility to change test features to implement cost-effective tests for a given application. From this point of view BIST based on Digital Signal Processors (DSP) can be a potential general solution, since a DSP provides a high degree of programmability and computational power. In addition to the general solution, test features must be developed for particular applications. The test capabilities of BIST and DSP should be integrated appropriately to obtain the optimal trade-off point between test cost, test accuracy and precision
This dissertation introduces five test features, loop-back mode, statistical characteristic equation, splitting method, signature-based approach based on ternary signal representation, and DSP-based test. Loop-back mode is introduced to achieve self-test, statistical characteristic equation is built in order to deal with the continuous nature of analog signals, the splitting method is developed to extract the characteristics of an individual block in a loop-back path, and the signature-based approach based on ternary signal representation is proposed to obtain a more accurate test while reducing the cost of built-in circuits. DSP-based test allows the reuse of existing circuitry to generate the input stimulus and for data post-processing, and is an excellent approach to realize low-cost test. Combining these features, the dynamic and static performance characterizations of on-chip converters, which are common modules in many mixed-signal devices, are implemented to demonstrate the feasibility of DSP-based BIST. In addition, the proposed implementations are analyzed in terms of test cost, test accuracy and precision
School code: 0227
DDC
Host Item Dissertation Abstracts International 65-08B
主題 Engineering, Electronics and Electrical
Computer Science
0544
0984
Alt Author The University of Texas at Austin
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