MARC 主機 00000nam  2200337   4500 
001    AAI3143498 
005    20051103093546.5 
008    051103s2004                        eng d 
020    0496014552 
035    (UnM)AAI3143498 
040    UnM|cUnM 
100 1  Yu, Hak-Soo 
245 10 BIST-based performance characterization of mixed-signal 
       circuits 
300    212 p 
500    Source: Dissertation Abstracts International, Volume: 65-
       08, Section: B, page: 4210 
500    Supervisor:  Jacob A. Abraham 
502    Thesis (Ph.D.)--The University of Texas at Austin, 2004 
520    Mixed-signal devices have been gaining popularity with 
       major thrusts in the development of wireless communication
       and multi-media markets. Consequently, testing such 
       circuits has become a crucial issue. This dissertation 
       focuses on the study of cost-effective test methods for 
       mixed-signal devices. Built-In Self-Test (BIST) has been 
       proposed and developed as one of the most promising 
       solutions for mixed-signal testing. However, most 
       techniques developed for mixed-signal BIST are application
       -specific rather than general purpose solutions. A general
       BIST approach would have the flexibility to change test 
       features to implement cost-effective tests for a given 
       application. From this point of view BIST based on Digital
       Signal Processors (DSP) can be a potential general 
       solution, since a DSP provides a high degree of 
       programmability and computational power. In addition to 
       the general solution, test features must be developed for 
       particular applications. The test capabilities of BIST and
       DSP should be integrated appropriately to obtain the 
       optimal trade-off point between test cost, test accuracy 
       and precision 
520    This dissertation introduces five test features, loop-back
       mode, statistical characteristic equation, splitting 
       method, signature-based approach based on ternary signal 
       representation, and DSP-based test. Loop-back mode is 
       introduced to achieve self-test, statistical 
       characteristic equation is built in order to deal with the
       continuous nature of analog signals, the splitting method 
       is developed to extract the characteristics of an 
       individual block in a loop-back path, and the signature-
       based approach based on ternary signal representation is 
       proposed to obtain a more accurate test while reducing the
       cost of built-in circuits. DSP-based test allows the reuse
       of existing circuitry to generate the input stimulus and 
       for data post-processing, and is an excellent approach to 
       realize low-cost test. Combining these features, the 
       dynamic and static performance characterizations of on-
       chip converters, which are common modules in many mixed-
       signal devices, are implemented to demonstrate the 
       feasibility of DSP-based BIST. In addition, the proposed 
       implementations are analyzed in terms of test cost, test 
       accuracy and precision 
590    School code: 0227 
590    DDC 
650  4 Engineering, Electronics and Electrical 
650  4 Computer Science 
690    0544 
690    0984 
710 20 The University of Texas at Austin 
773 0  |tDissertation Abstracts International|g65-08B 
856 40 |uhttp://pqdd.sinica.edu.tw/twdaoapp/servlet/
       advanced?query=3143498