LEADER 00000nam a22004333i 4500
001 EBC257584
003 MiAaPQ
005 20200713055110.0
006 m o d |
007 cr cnu||||||||
008 200713s2000 xx o ||||0 eng d
020 9781580534710|q(electronic bk.)
020 |z9781580531078
035 (MiAaPQ)EBC257584
035 (Au-PeEL)EBL257584
035 (CaPaEBR)ebr10607835
035 (OCoLC)437165562
040 MiAaPQ|beng|erda|epn|cMiAaPQ|dMiAaPQ
050 4 TK7895.E42 -- R37 2000eb
082 0 621.395
100 1 Rajsuman, Rochit
245 10 System-on-a-chip :|bDesign And Test
264 1 Norwood :|bArtech House,|c2000
264 4 |c©2000
300 1 online resource (289 pages)
336 text|btxt|2rdacontent
337 computer|bc|2rdamedia
338 online resource|bcr|2rdacarrier
505 0 Intro -- Contents v -- Preface xi -- Acknowledgment
xiii -- Part I: Design 1 -- 1 Introduction 3 -- 1.1
Architecture of the Present-Day SoC 5 -- 1.2 Design
Issues of SoC 8 -- 1.3 Hardware-Software Codesign 14 --
1.4 Core Libraries, EDA Tools, and Web Pointers 21 --
References 29 -- 2 Design Methodology for Logic Cores
33 -- 2.1 SoC Design Flow 34 -- 2.2 General Guidelines
for Design Reuse 36 -- 2.3 Design Process for Soft and
Firm Cores 43 -- 2.4 Design Process for Hard Cores 47 -
- 2.5 Sign-Off Checklist and Deliverables 51 -- 2.6
System Integration 53 -- References 55 -- 3 Design
Methodology for Memory and Analog Cores 57 -- 3.1 Why
Large Embedded Memories 57 -- 3.2 Design Methodology for
Embedded Memories 59 -- 3.3 Specifications of Analog
Circuits 72 -- 3.4 High-Speed Circuits 79 -- References
83 -- 4 Design Validation 85 -- 4.1 Core-Level
Validation 86 -- 4.2 Core Interface Verification 93 --
4.3 SoC Design Validation 95 -- Reference 103 -- 5
Core and SoC Design Examples 105 -- 5.1 Microprocessor
Cores 105 -- 5.2 Comments on Memory Core Generators 112
-- 5.3 Core Integration and On-Chip Bus 113 -- 5.4
Examples of SoC 115 -- References 122 -- Part II: Test
123 -- 6 Testing of Digital Logic Cores 125 -- 6.1 SoC
Test Issues 126 -- 6.2 Access, Control, and Isolation
128 -- 6.3 IEEE P1500 Effort 129 -- 6.4 Core Test and
IP Protection 138 -- 6.5 Test Methodology for Design
Reuse 142 -- 6.6 Testing of Microprocessor Cores 144 --
References 152 -- 7 Testing of Embedded Memories 155 --
7.1 Memory Fault Models and Test Algorithms 156 -- 7.2
Test Methods for Embedded Memories 162 -- 7.3 Memory
Redundancy and Repair 171 -- 7.4 Error Detection and
Correction Codes 175 -- 7.5 Production Testing of SoC
With Large Embedded Memory 176 -- References 177
505 8 8 Testing of Analog and Mixed-Signal Cores 181 -- 8.1
Analog Parameters and Characterization 182 -- 8.2 Design
-for-Test and Built-in Self-Test Methods for Analog Cores
191 -- 8.3 Testing of Specific Analog Circuits 200 --
References 204 -- 9 Iddq Testing 207 -- 9.1 Physical
Defects 207 -- 9.2 Iddq Testing Difficulties in SoC 219
-- 9.3 Design-for-Iddq-Testing 115 -- 9.4 Design Rules
for Iddq Testing 230 -- 9.5 Iddq Test Vector Generation
231 -- References 236 -- 10 Production Testing 239 --
10.1 Production Test Flow 239 -- 10.2 At-Speed Testing
241 -- 10.3 Production Throughput and Material Handling
246 -- References 249 -- 11 Summary and Conclusions 251
-- 11.1 Summary 251 -- 11.2 Future Scenarios 254 --
Appendix: RTL Guidelines for Design Reuse 257 -- A.1
Naming Convention 257 -- A.2 General Coding Guidelines
258 -- A.3 RTL Development for Synthesis 260 -- A.4 RTL
Checks 262 -- About the Author 265 -- Index 267
520 Starting with a basic overview of system-on-a-chip (SoC)
including definitions of related terms, this text explains
SoC design challenges, together with developments in SoC
design and and test methodologies
588 Description based on publisher supplied metadata and other
sources
590 Electronic reproduction. Ann Arbor, Michigan : ProQuest
Ebook Central, 2020. Available via World Wide Web. Access
may be limited to ProQuest Ebook Central affiliated
libraries
650 0 Embedded computer systems -- Design and
construction.;Embedded computer systems --
Testing.;Application specific integrated circuits --
Design and construction
655 4 Electronic books
700 1 Ling, Hao
776 08 |iPrint version:|aRajsuman, Rochit|tSystem-on-a-chip :
Design And Test|dNorwood : Artech House,c2000
|z9781580531078
856 40 |uhttps://ebookcentral.proquest.com/lib/sinciatw/
detail.action?docID=257584|zClick to View
