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Author Research Symposium on Characterization and Behavior of Interfaces (2008 : Atlanta, Ga.)
Title Characterization and behavior of interfaces [electronic resource] : proceedings of Research Symposium on Characterization and Behavior of Interfaces, 21 September 2008, Atlanta, Georgia, USA / edited by J. David Frost
Imprint Amsterdam ; Fairfax, VA : IOS Press, c2010
book jacket
Descript x, 155 p. : ill. ; 25 cm
Note Includes bibliographical references and indexes
Subject Engineering geology -- Congresses
Surfaces (Technology) -- Congresses
Alt Author Frost, J. David
Georgia Institute of Technology
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