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Author Fujiwara, Hideo
Title Logic testing and design for testability / Hideo Fujiwara
Imprint Cambridge, Mass. : MIT Press, c1985
book jacket
LOCATION CALL # STATUS OPACMSG BARCODE
 Inform. Sci. Books  B6.2 F9613    AVAILABLE    30330000047733
Descript x, 284 p. : ill. ; 24 cm
Series MIT Press series in computer systems
Note Bibliography: p. [272]-278
Includes index
Subject Logic circuits -- Testing
Logic testing iisf
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