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Author Goodhew, Peter J
Title Electron Microscopy and Analysis
Imprint London : Taylor & Francis Group, 2000
©2000
book jacket
Edition 3rd ed
Descript 1 online resource (264 pages)
text txt rdacontent
computer c rdamedia
online resource cr rdacarrier
Note Cover -- Half Title -- Title Page -- Copyright Page -- Table of Contents -- Acronyms -- Preface -- 1: Microscopy with light and electrons -- 1.1 Introduction -- 1.2 Methods of image formation -- 1.3 Pixels -- 1.4 The light-optical microscope -- 1.5 Magnification -- 1.6 Resolution -- 1.7 Depth of field arid depth of focus -- 1.8 Aberrations in optical systems -- 1.9 Electrons versus light -- 1.10 Questions -- 2: Electrons and their interaction with the specimen -- 2.1 Introduction -- 2.2 Electrons -- 2.3 Generating a beam of electrons -- 2.4 Deflection of electrons - magnetic lenses -- 2.5 The scattering of electrons by atoms -- 2.6 Elastic scattering -- 2.7 Inelastic scattering -- 2.8 Secondary effects -- 2.9 The family of electron microscopes -- 2.10 Questions -- 3: Electron diffraction -- 3.1 The geometry of electron diffraction -- 3.2 Diffraction spot patterns -- 3.3 Use of the reciprocal lattice in diffraction analysis -- 3.4 Other types of diffraction pattern -- 3.5 Questions -- 4: The transmission electron microscope -- 4.1 The instrument -- 4.2 Contrast mechanisms -- 4.3 High voltage electron microscopy (HVEM) -- 4.4 Scanning transmission electron microscopy (STEM) -- 4.5 Preparation of specimens for TEM -- 4.6 Questions -- 5: The scanning electron microscope -- 5.1 How it works -- 5.2 Obtaining a signal in the SEM -- 5.3 The optics of the SEM -- 5.4 The performance of the SEM -- 5.5 The ultimate resolution of the SEM -- 5.6 Topographic images -- 5.7 Compositional images -- 5.8 Crystallographic information from the SEM -- 5.9 The use of other signals in the SEM -- 5.10 Image acquisition, processing and storage -- 5.11 The preparation of specimens for examination in the SEM -- 5.12 Low voltage microscopy -- 5.13 Environmental scanning electron microscopy (ESEM) -- 5.14 Questions -- 6: Chemical analysis in the electron microscope
6.1 The generation of X-rays within a specimen -- 6.2 Detection and counting of X-rays -- 6.3 X-ray analysis of bulk specimens -- 6.4 X-ray analysis of thin specimens in the TEM -- 6.5 Quantitative analysis in an electron microscope -- 6.6 Electron energy loss spectroscopy (EELS) -- 6.7 A brief comparison of techniques -- 6.8 Questions -- 7: Electron microscopy and other techniques -- 7.1 Complementary imaging techniques -- 7.2 Complementary analysis techniques - alternative analysis systems -- 7.3 Complementary diffraction techniques -- 7.4 Summary -- 7.5 Questions -- Further reading -- Answers -- Index
Electron Microscopy and Analysis deals with several sophisticated techniques for magnifying images of very small objects by large amounts - especially in a physical science context. It has been ten years since the last edition of Electron Microscopy and Analysis was published and there have been rapid changes in this field since then. The authors have vastly updated their very successful second edition, which is already established as an essential laboratory manual worldwide, and they have incorporated questions and answers in each chapter for ease of learning. Equally as relevant for material scientists and bioscientists, this third edition is an essential textbook
Description based on publisher supplied metadata and other sources
Electronic reproduction. Ann Arbor, Michigan : ProQuest Ebook Central, 2020. Available via World Wide Web. Access may be limited to ProQuest Ebook Central affiliated libraries
Link Print version: Goodhew, Peter J. Electron Microscopy and Analysis London : Taylor & Francis Group,c2000 9780748409686
Subject Electron microscopy
Electronic books
Alt Author Humphreys, John
Beanland, Richard
Cartwright, L. E
Humphreys, F. J
Beanland, Richard
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