LEADER 00000nam  2200349 a 4500 
001    978-3-642-01494-9 
003    Springer 
005    20100303093932.0 
006    m        d         
007    cr nn 008maaau 
008    090918s2009    gw         j        eng d 
020    9783642014956 (electronic bk.) 
020    9783642014949 (paper) 
050 04 QH212.A78|bN663 2009 
082 04 620.5|222 
245 00 Noncontact atomic force microscopy.|nVolume 2|h[electronic
       resource] /|cedited by Seizo Morita, Franz J. Giessibl, 
       Roland Wiesendanger 
260    Berlin, Heidelberg :|bSpringer-Verlag Berlin Heidelberg,
       |c2009 
300    417 p. :|bill., digital ;|c24 cm 
440  0 Nanoscience and technology,|x1434-4904 
590    Springer 
650  0 Atomic force microscopy 
650 14 Material Science 
650 24 Condensed Matter Physics 
650 24 Engineering, general 
650 24 Nanotechnology 
700 1  Morita, Seizo 
700 1  Giessibl, Franz J 
700 1  Wiesendanger, Roland 
710 2  SpringerLink (Online service) 
773 0  |tSpringer eBooks 
856 40 |uhttp://dx.doi.org/10.1007/978-3-642-01495-6|zE-
       Book(SpringerLink)