LEADER 00000nam a2200517 i 4500 
001    978-3-319-15588-3 
003    DE-He213 
005    20151210132132.0 
006    m     o  d         
007    cr nn 008maaau 
008    150518s2015    gw      s         0 eng d 
020    9783319155883 (electronic bk.) 
020    9783319155876 (paper) 
024 7  10.1007/978-3-319-15588-3|2doi 
040    GP|cGP|erda|dAS 
041 0  eng 
050  4 QH212.A78|bN663 2015 
082 04 620.5|222 
245 00 Noncontact atomic force microscopy.|nVolume 3 /|cedited by
       Seizo Morita, Franz J. Giessibl, Ernst Meyer, Roland 
       Wiesendanger 
264  1 Cham :|bSpringer International Publishing :|bImprint: 
       Springer,|c2015 
300    1 online resource (xxii, 527 pages) :|billustrations, 
       digital ;|c24 cm 
336    text|btxt|2rdacontent 
337    computer|bc|2rdamedia 
338    online resource|bcr|2rdacarrier 
347    text file|bPDF|2rda 
490 1  NanoScience and technology,|x1434-4904 
505 0  From the Contents: Introduction -- 3D Force-Field 
       Spectroscopy -- Simultaneous NC-AFM/STM Measurements of 
       Atomic-Sized Contacts -- Spectroscopy and Manipulation 
       Using AFM/STM at Room Temperature -- The Phantom Force - 
       The Influence of a Tunnel Current on Force Microscopy -- 
       Non-Contact Friction -- Magnetic Exchange Force 
       Spectroscopy 
520    This book presents the latest developments in noncontact 
       atomic force microscopy. It deals with the following 
       outstanding functions and applications that have been 
       obtained with atomic resolution after the publication of 
       volume 2: (1) Pauli repulsive force imaging of molecular 
       structure, (2) Applications of force spectroscopy and 
       force mapping with atomic resolution, (3) Applications of 
       tuning forks, (4) Applications of atomic/molecular 
       manipulation, (5) Applications of magnetic exchange force 
       microscopy, (6) Applications of atomic and molecular 
       imaging in liquids, (7) Applications of combined AFM/STM 
       with atomic resolution, and (8) New technologies in 
       dynamic force microscopy. These results and technologies 
       are now expanding the capacity of the NC-AFM with imaging 
       functions on an atomic scale toward making them 
       characterization and manipulation tools of individual 
       atoms/molecules and nanostructures, with outstanding 
       capability at the level of molecular, atomic, and 
       subatomic resolution. Since the publication of vol. 2 of 
       the book Noncontact Atomic Force Microscopy in 2009 the 
       noncontact atomic force microscope, which can image even 
       insulators with atomic resolution, has achieved remarkable
       progress. The NC-AFM is now becoming crucial for 
       nanoscience and nanotechnology 
650  0 Atomic force microscopy 
650 14 Physics 
650 24 Nanoscale Science and Technology 
650 24 Surfaces and Interfaces, Thin Films 
650 24 Spectroscopy and Microscopy 
650 24 Nanotechnology 
700 1  Morita, Seizo,|eeditor 
700 1  Giessibl, Franz J.,|eeditor 
700 1  Meyer, Ernst,|eeditor 
700 1  Wiesendanger, Roland,|eeditor 
710 2  SpringerLink (Online service) 
773 0  |tSpringer eBooks 
830  0 NanoScience and technology 
856 40 |uhttp://dx.doi.org/10.1007/978-3-319-15588-3
       |zeBook(Springerlink)