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Author International Conference on Frontiers of Characterization and Metrology for Nanoelectronics (2011 : Grenoble, France)
Title Frontiers of characterization and metrology for nanoelectronics, 2011 : Grenoble, France, 23-26 May 2011 / editors, David G. Seiler ... [et al.]
Imprint Melville, N.Y. : American Institute of Physics, 2011
book jacket
LOCATION CALL # STATUS OPACMSG BARCODE
 Physics Library  QC1 A512  v. 1395    AVAILABLE    30350000480379
Descript xi, 377 p. : ill. ; 29 cm. + 1 CD-ROM ( 4 3/4 in.)
Series AIP conference proceedings, 0094-243X ; 1395
AIP conference proceedings ; no. 1395
Note Includes bibliographical references and indexes
System requirements for accompanying disc: Computer workstation and CD-ROM drive
Subject Nanoelectronics -- Congresses
Semiconductors -- Characterization -- Congresses
Semiconductors -- Measurement -- Congresses
Alt Author Seiler, David G
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