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Author Czanderna, A. W
Title Beam Effects, Surface Topography, and Depth Profiling in Surface Analysis
Imprint Hingham : Kluwer Academic Publishers, 1998
©1998
book jacket
Descript 1 online resource (451 pages)
text txt rdacontent
computer c rdamedia
online resource cr rdacarrier
Note Intro -- Contents
Description based on publisher supplied metadata and other sources
Electronic reproduction. Ann Arbor, Michigan : ProQuest Ebook Central, 2020. Available via World Wide Web. Access may be limited to ProQuest Ebook Central affiliated libraries
Link Print version: Czanderna, A. W. Beam Effects, Surface Topography, and Depth Profiling in Surface Analysis Hingham : Kluwer Academic Publishers,c1998 9780306458965
Subject Surfaces (Technology) -- Analysis.;Materials -- Effect of radiation on
Electronic books
Alt Author Madey, T. E
Powell, C. J
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