LEADER 00000nam  2200397 a 4500 
001    EBC807153 
003    MiAaPQ 
006    m     o  d |       
007    cr cn||||||||| 
008    110801s2012    enka    sb    001 0 eng d 
010    |z2011027239 
020    |z9780521762106 (hardback) 
020    |z9781139157445 (e-book) 
035    (MiAaPQ)EBC807153 
035    (Au-PeEL)EBL807153 
035    (CaPaEBR)ebr10514175 
035    (CaONFJC)MIL334235 
035    (OCoLC)773039086 
040    MiAaPQ|cMiAaPQ|dMiAaPQ 
050  4 TK7871.9|b.N66 2012 
082 04 621.3815/28|223 
245 00 Nonlinear transistor model parameter extraction techniques
       |h[electronic resource] /|cedited by Matthias Rudolph, 
       Christian Fager, David E. Root 
260    Cambridge ;|aNew York :|bCambridge University Press,
       |cc2012 
300    xiv, 352 p. :|bill 
490 1  The Cambridge RF and microwave engineering series 
504    Includes bibliographical references and index 
533    Electronic reproduction. Ann Arbor, MI : ProQuest, 2015. 
       Available via World Wide Web. Access may be limited to 
       ProQuest affiliated libraries 
650  0 Transistors|xMathematical models 
650  0 Electronic circuit design 
655  4 Electronic books 
700 1  Fager, Christian 
700 1  Root, David E 
700 1  Rudolph, Matthias,|d1969- 
710 2  ProQuest (Firm) 
830  0 Cambridge RF and microwave engineering series 
856 40 |uhttps://ebookcentral.proquest.com/lib/sinciatw/
       detail.action?docID=807153|zClick to View