Descript |
1 online resource (325 pages) |
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text txt rdacontent |
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computer c rdamedia |
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online resource cr rdacarrier |
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Intro -- 1 Theoretical Basis -- 1.1 Matrices, Vectors -- 1.2 Fundamental Results of Diffraction Theory -- 2 Preliminary Experiments -- 2.1 Film Methods -- 2.2 X-Rays -- 2.3 Practicing Film Techniques -- 3 Crystal Symmetry -- 3.1 Symmetry Operations in a Crystal Lattice -- 3.2 Crystal Symmetry and Related Intensity Symmetry -- 3.3 Space Group Determination -- 4 Diffractometer Measurements -- 4.1 Main Characteristics of a Four-Circle Diffractometer -- 4.2 Single Crystal Measurements -- 5 Solution of the Phase Problem -- 5.1 Preparation of the Intensity Data -- 5.2 Fourier Methods -- 5.3 Direct Methods -- 6 Refinement -- 6.1 Theoretical Aspects -- 6.2 Practising Least-Squares Methods -- 6.3 Analysis and Representation of Results -- 6.4 Applications to the Test Structures -- Index |
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Description based on publisher supplied metadata and other sources |
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Electronic reproduction. Ann Arbor, Michigan : ProQuest Ebook Central, 2020. Available via World Wide Web. Access may be limited to ProQuest Ebook Central affiliated libraries |
Link |
Print version: Luger, Peter Modern X-Ray Analysis on Single Crystals
Berlin/Boston : De Gruyter, Inc.,c1980 9783110068306
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Subject |
X-ray crystallography
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Electronic books
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