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Author Luger, Peter
Title Modern X-Ray Analysis on Single Crystals
Imprint Berlin/Boston : De Gruyter, Inc., 1980
©1980
book jacket
Descript 1 online resource (325 pages)
text txt rdacontent
computer c rdamedia
online resource cr rdacarrier
Note Intro -- 1 Theoretical Basis -- 1.1 Matrices, Vectors -- 1.2 Fundamental Results of Diffraction Theory -- 2 Preliminary Experiments -- 2.1 Film Methods -- 2.2 X-Rays -- 2.3 Practicing Film Techniques -- 3 Crystal Symmetry -- 3.1 Symmetry Operations in a Crystal Lattice -- 3.2 Crystal Symmetry and Related Intensity Symmetry -- 3.3 Space Group Determination -- 4 Diffractometer Measurements -- 4.1 Main Characteristics of a Four-Circle Diffractometer -- 4.2 Single Crystal Measurements -- 5 Solution of the Phase Problem -- 5.1 Preparation of the Intensity Data -- 5.2 Fourier Methods -- 5.3 Direct Methods -- 6 Refinement -- 6.1 Theoretical Aspects -- 6.2 Practising Least-Squares Methods -- 6.3 Analysis and Representation of Results -- 6.4 Applications to the Test Structures -- Index
Description based on publisher supplied metadata and other sources
Electronic reproduction. Ann Arbor, Michigan : ProQuest Ebook Central, 2020. Available via World Wide Web. Access may be limited to ProQuest Ebook Central affiliated libraries
Link Print version: Luger, Peter Modern X-Ray Analysis on Single Crystals Berlin/Boston : De Gruyter, Inc.,c1980 9783110068306
Subject X-ray crystallography
Electronic books
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