Home | Help | New Search | 中文模式

AS Library Service 


Start Over Hold this item Export MARC Display Return To Browse Another Search
   
Record:   Prev Next
Author International Test Conference (15th : 1984 : Philadelphia, Pa.)
Title The three faces of test : design, characterization, production : International Test Conference, 1984 proceedings, October 16, 17, 18, 1984 / sponsored by the IEEE Computer Society, Test Technology Committee, IEEE Philadelphia Section
Imprint Silver Spring, MD : IEEE Computer Society Press, c1984
 book jacket
LOCATION CALL # STATUS OPACMSG BARCODE
 Inform. Sci. Proceeding  Proc B4.5 T342 1984    LIB USE ONLY    30330000040001
Descript xxxi, 886 p. : ill. ; 28 cm
Note Spine title: International Test Conference 1984 proceedings
"IEEE catalog no. 84CH2084-2."
"Computer Society order no. 548."
Includes bibliographical references and index
Subject Integrated circuits -- Testing -- Congresses
Semiconductors -- Testing -- Congresses
Testing iisf
Alt Author IEEE Computer Society. Test Technology Committee
Institute of Electrical and Electronics Engineers. Philadelphia Section
Alt Title International Test Conference 1984 proceedings
3 faces of test
Record:   Prev Next
Start Over Hold this item Export MARC Display Return To Browse Another Search


Home | Help | 中文模式