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Author International Test Conference (1987 : Washington, D.C.)
Title Integration of test with design and manufacturing : International Test Conference 1987 proceedings, September 1-3, 1987, Sheraton Washington Hotel, Washington, DC / sponsored by the IEEE Computer Society, test Technology Technical Committee and the IEEE Philadelphia Section
Imprint Washington, D.C. : Computer Society Press, c1987
book jacket
LOCATION CALL # STATUS OPACMSG BARCODE
 Inform. Sci. Proceeding  Proc B4.5 T342 1987  pt.1    LIB USE ONLY    30330000062013
 Inform. Sci. Proceeding  Proc B4.5 T342 1987  pt.2    LIB USE ONLY    30330000060934
Descript 2 parts(xxxi, 1150 p.) : ill. ; 28 cm
Note "IEEE catalog number 87CH2347-2."
"18 Anniversary"
"Integration of test with design and manufacturing"--cover title
Includes bibliographies and index
Subject Integrated circuits -- Testing -- Congresses
Electronic digital computers -- Circuits -- Testing -- Congresses
Automatic checkout equipment -- Congresses
Testing iisf
Alt Author IEEE Computer Society. Test Technology Technical Committee
Institute of Electrical and Electronics Engineers. Philadelphia Section
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