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Author International Test Conference (1989 : Washington, D.C.)
Title Meeting the tests of time : International Test Conference, August 29-31, 1989, Sheraton Washington Hotel, Washington, D.C. / sponsored by the IEEE Computer Society, test Technology Technical Committee and the IEEE Philadelphia Section
Imprint Washington, D.C. : Computer Society Press, c1989
 book jacket
LOCATION CALL # STATUS OPACMSG BARCODE
 Inform. Sci. Proceeding  Proc B4.5 T342 1989    LIB USE ONLY    30330000067657
Descript xxxiv, 959 p. : ill. ; 28 cm
Note "Computer Society order number 1962."
"IEEE catalog number 89CH2742-5."
"20 Anniversary"
Includes bibliographies and index
Subject Integrated circuits -- Testing -- Congresses
Electronic digital computers -- Circuits -- Testing -- Congresses
Automatic checkout equipment -- Congresses
Testing iisf
Alt Author IEEE Computer Society. Test Technology Technical Committee
Institute of Electrical and Electronics Engineers. Philadelphia Section
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