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Title Tutorial test generation for VLSI chips / [edited by] Vishwani D. Agrawal and Sharad C. Seth
Imprint Washington, D.C. : Computer Society Press ; Los Angeles, CA : Order from Computer Society, c1988
 book jacket
LOCATION CALL # STATUS OPACMSG BARCODE
 Inform. Sci. Books  B7.3 A277    AVAILABLE    30330000061783
Descript x, 401 p. : ill. ; 29 cm
Subject Integrated circuits -- Very large scale integration -- Testing
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VLSI testing iisf
Alt Author Agrawal, Vishwani D., 1943-
Seth, Sharad C
IEEE Computer Society
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