LEADER 00000nam  2200000   4500 
008    940907s1986    miua     b    000 0 eng d 
040    AS|cAS|dIIS 
100 1  You, Younggap 
245 10 Self-testing vlsi circuits /|cYounggap You 
260    Ann Arbor, Mich. :|bUMI,|cc1986 
300    ix, 187 p. :|bill. ;|c22 cm 
502    Thesis (Ph.D.)--The University of Michigan, 1986 
504    Includes bibliographical references 
650  7 VLSI|2iis 
650  7 Testing|2iisf 
LOCATION CALL # STATUS OPACMSG BARCODE
 Inform. Sci. Dissert.  Diss B7.3 Y67 1986    AVAILABLE    30330000056981