Record:   Prev Next
Author Ohring, Milton, 1936-
Title Reliability and failure of electronic materials and devices / Milton Ohring, Lucian Kasprzak
Imprint Amsterdam ; Boston : Academic Press is an imprint of Elsevier, 2014
book jacket
 Inform. Sci. Books  b8.2 O38 2014    AVAILABLE    30330000229646
Edition Second edition
Descript xxiv, 734 pages : illustrations ; 24 cm
text rdacontent
unmediated rdamedia
volume rdacarrier
Note Includes index
"Reliability and Failure of Electronic Materials and Devices is a well-established and well-regarded reference work offering unique, single-source coverage of most major topics related to the performance and failure of materials used in electronic devices and electronics packaging. With a focus on statistically predicting failure and product yields, this book can help the design engineer, manufacturing engineer, and quality control engineer all better understand the common mechanisms that lead to electronics materials failures, including dielectric breakdown, hot-electron effects, and radiation damage. This new edition adds cutting-edge knowledge gained both in research labs and on the manufacturing floor, with new sections on plastics and other new packaging materials, new testing procedures, and new coverage of MEMS devices"-- Provided by publisher
Machine generated contents note: CH 1 An Overview of Electronic Devices and Their Reliability CH 2 Electronic Devices: Materials Properties Determine How They Operate and Are Fabricated CH 3 Defects, Contamination and Yield CH 4 The Mathematics of Failure and Reliability CH 5 Mass Transport-Induced Failure Ch 6 Electronic Charge-Induced Damage CH 7 Environmental Damage to Electronic Products CH 8 Packaging Materials, Processes, and Stresses CH 9 Degradation of Contacts and Packages CH 10 Degradation and Failure of Electro-Optical and Magnetic Materials and Devices CH 11 Characterization and Failure Analysis of Material, Devices and Packages CH 12 Future Directions and Reliability Issues
Subject Electronic apparatus and appliances -- Reliability
System failures (Engineering)
Alt Author Kasprzak, Lucian
Record:   Prev Next