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作者 International Test Conference (15th : 1984 : Philadelphia, Pa.)
書名 The three faces of test : design, characterization, production : International Test Conference, 1984 proceedings, October 16, 17, 18, 1984 / sponsored by the IEEE Computer Society, Test Technology Committee, IEEE Philadelphia Section
出版項 Silver Spring, MD : IEEE Computer Society Press, c1984
國際標準書號 0818605480 (pbk.)
book jacket
館藏地 索書號 處理狀態 OPAC 訊息 條碼
 資訊所圖書室會議論文區  Proc B4.5 T342 1984    館內使用    30330000040001
說明 xxxi, 886 p. : ill. ; 28 cm
附註 Spine title: International Test Conference 1984 proceedings
"IEEE catalog no. 84CH2084-2."
"Computer Society order no. 548."
Includes bibliographical references and index
主題 Integrated circuits -- Testing -- Congresses
Semiconductors -- Testing -- Congresses
Testing iisf
Alt Author IEEE Computer Society. Test Technology Committee
Institute of Electrical and Electronics Engineers. Philadelphia Section
Alt Title International Test Conference 1984 proceedings
3 faces of test
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