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書名 Reliability and degradation : semiconductor devices and circuits / edited by M.J. Howes, D.V. Morgan
出版項 Chichester ; New York : J. Wiley, c1981
國際標準書號 0471280283
book jacket
館藏地 索書號 處理狀態 OPAC 訊息 條碼
 統計所圖書館  TK7871.85 R44 1981    在架上    30570000022794
說明 xii, 444 p. : ill. ; 24 cm
系列 The Wiley series in solid state devices and circuits
附註 Includes bibliographical references and index
主題 Semiconductors -- Reliability
Alt Author Howes, M. J
Morgan, D. V
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